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Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability - Frontiers in Electronic Testing 2008 edition
Mohammad Tehranipoor
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Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability - Frontiers in Electronic Testing 2008 edition
Mohammad Tehranipoor
Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes.
424 pages, 1, black & white illustrations
Medie | Bøger Hardcover bog (Bog med hård ryg og stift omslag) |
Udgivet | 10. december 2007 |
ISBN13 | 9780387747460 |
Forlag | Springer-Verlag New York Inc. |
Antal sider | 408 |
Mål | 155 × 235 × 23 mm · 811 g |
Sprog | Engelsk |
Klipper/redaktør | Tehranipoor, Mohammad |
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