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Design for AT-Speed Test, Diagnosis and Measurement - Frontiers in Electronic Testing 2000 edition
Benoit Nadeau-dostie
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Design for AT-Speed Test, Diagnosis and Measurement - Frontiers in Electronic Testing 2000 edition
Benoit Nadeau-dostie
Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels.
239 pages, biography
| Medie | Bøger Hardcover bog (Bog med hård ryg og stift omslag) |
| Udgivet | 30. september 1999 |
| ISBN13 | 9780792386698 |
| Forlag | Springer |
| Antal sider | 239 |
| Mål | 178 × 254 × 15 mm · 653 g |
| Sprog | Engelsk |
| Klipper/redaktør | Nadeau-Dostie, Benoit |
Se alt med Benoit Nadeau-dostie ( f.eks. Hardcover bog og Paperback Bog )