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Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis - Methods of Surface Characterization 2002 edition
A W Czanderna
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Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis - Methods of Surface Characterization 2002 edition
A W Czanderna
The guidance given in these chapters allows the scientist to understand how to obtain the most precise and understood measu- ments that are currently possible and, where there are inevitable problems, to have clear guidance as the extent of the problem and its likely behavior.
430 pages, biography
| Medie | Bøger Hardcover bog (Bog med hård ryg og stift omslag) |
| Udgivet | 31. oktober 1998 |
| ISBN13 | 9780306458965 |
| Forlag | Springer Science+Business Media |
| Antal sider | 430 |
| Mål | 156 × 234 × 25 mm · 811 g |
| Klipper/redaktør | Czanderna, Alvin W. |
| Klipper/redaktør | Madey, Theodore E. |
| Klipper/redaktør | Powell, Cedric J. |
Se alt med A W Czanderna ( f.eks. Hardcover bog )