Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis - Methods of Surface Characterization - A W Czanderna - Bøger - Springer Science+Business Media - 9780306458965 - 31. oktober 1998
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Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis - Methods of Surface Characterization 2002 edition

A W Czanderna

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Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis - Methods of Surface Characterization 2002 edition

The guidance given in these chapters allows the scientist to understand how to obtain the most precise and understood measu- ments that are currently possible and, where there are inevitable problems, to have clear guidance as the extent of the problem and its likely behavior.


430 pages, biography

Medie Bøger     Hardcover bog   (Bog med hård ryg og stift omslag)
Udgivet 31. oktober 1998
ISBN13 9780306458965
Forlag Springer Science+Business Media
Antal sider 430
Mål 156 × 234 × 25 mm   ·   811 g
Klipper/redaktør Czanderna, Alvin W.
Klipper/redaktør Madey, Theodore E.
Klipper/redaktør Powell, Cedric J.