Integrated Circuit Defect-Sensitivity: Theory and Computational Models - The Springer International Series in Engineering and Computer Science - Jose Pineda de Gyvez - Bøger - Springer - 9780792393061 - 31. december 1992
Ved uoverensstemmelse mellem cover og titel gælder titel

Integrated Circuit Defect-Sensitivity: Theory and Computational Models - The Springer International Series in Engineering and Computer Science 1993 edition

Jose Pineda de Gyvez

Pris
Mex$ 2.870

Bestilles fra fjernlager

Forventes klar til forsendelse 6. - 13. aug.

Vores kunder siger:

14 dages fuld returret
Topvurdering på Trustpilot
Tilføj til din iMusic ønskeseddel
Eller

Findes også som:

Integrated Circuit Defect-Sensitivity: Theory and Computational Models - The Springer International Series in Engineering and Computer Science 1993 edition

The expectation was that many small design companies would share the investment into the extremely costful Silicon fabrication plants while designing large lots of application-specific integrated circuits (ASIC's).

167 pages, 48 black & white illustrations, biography

Medie Bøger     Hardcover bog   (Bog med hård ryg og stift omslag)
Udgivet 31. december 1992
ISBN13 9780792393061
Forlag Springer
Antal sider 167
Mål 155 × 235 × 12 mm   ·   453 g
Sprog Engelsk  

Se alt med Jose Pineda de Gyvez ( f.eks. Hardcover bog og Paperback Bog )