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Data Mining and Diagnosing IC Fails - Frontiers in Electronic Testing Softcover reprint of hardcover 1st ed. 2005 edition
Leendert M. Huisman
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Data Mining and Diagnosing IC Fails - Frontiers in Electronic Testing Softcover reprint of hardcover 1st ed. 2005 edition
Leendert M. Huisman
The second part contains all the mathematical details that are necessary to prove the validity of the analysis techniques, the existence of solutions to the problems that those techniques engender, and the correctness of several properties that were assumed in the first part.
250 pages, 46 black & white illustrations, biography
| Medie | Bøger Paperback Bog (Bog med blødt omslag og limet ryg) |
| Udgivet | 8. december 2010 |
| ISBN13 | 9781441937674 |
| Forlag | Springer-Verlag New York Inc. |
| Antal sider | 250 |
| Mål | 155 × 235 × 14 mm · 385 g |
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