Neural Models and Algorithms for Digital Testing - The Springer International Series in Engineering and Computer Science - S.T. Chadradhar - Bøger - Springer-Verlag New York Inc. - 9781461367673 - 28. september 2012
Ved uoverensstemmelse mellem cover og titel gælder titel

Neural Models and Algorithms for Digital Testing - The Springer International Series in Engineering and Computer Science Softcover reprint of the original 1st ed. 1991 edition

S.T. Chadradhar

Pris
DKK 861

Bestilles fra fjernlager

Forventes klar til forsendelse 13. - 19. aug.

Vores kunder siger:

14 dages fuld returret
Topvurdering på Trustpilot
Tilføj til din iMusic ønskeseddel
Eller

Findes også som:

Neural Models and Algorithms for Digital Testing - The Springer International Series in Engineering and Computer Science Softcover reprint of the original 1st ed. 1991 edition

References . . . . . . . . . . . . . . . . . . . . . 2 Notation and Tenninology . 3 Minimization Technique . 4 An Example . 1 Transitive Oosure . 3 Path Sensitization . 100 References . 1 Background . 6 Summary 119 References . 2 Contribution of the Present Work . 139 References . 3 Logic Circuit Modeling . 1 Modelfor a Boolean Gate .

197 pages, biography

Medie Bøger     Paperback Bog   (Bog med blødt omslag og limet ryg)
Udgivet 28. september 2012
ISBN13 9781461367673
Forlag Springer-Verlag New York Inc.
Antal sider 184
Mål 155 × 235 × 11 mm   ·   290 g
Sprog Engelsk  

Se alt med S.T. Chadradhar ( f.eks. Hardcover bog og Paperback Bog )