Design and Test Technology for Dependable Systems-on-chip (Premier Reference Source) - Raimund Ubar - Bøger - IGI Global - 9781609602123 - 31. marts 2011
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Design and Test Technology for Dependable Systems-on-chip (Premier Reference Source) 1. udgave

Raimund Ubar

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Design and Test Technology for Dependable Systems-on-chip (Premier Reference Source) 1. udgave

Designing reliable and dependable embedded systems has become increasingly important as the failure of these systems in an automotive, aerospace or nuclear application can have serious consequences.

Design and Test Technology for Dependable Systems-on-Chip covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC). This book provides insight into refined "classical" design and test topics and solutions for IC test technology and fault-tolerant systems.

Medie Bøger     Hardcover bog   (Bog med hård ryg og stift omslag)
Udgivet 31. marts 2011
ISBN13 9781609602123
Forlag IGI Global
Antal sider 578
Mål 218 × 284 × 36 mm   ·   1,61 kg
Sprog Engelsk  
Medvirkende Heinrich Theodor Vierhaus
Medvirkende Jaan Raik
Medvirkende Raimund Ubar

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