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CMOS RF Circuit Design for Reliability and Variability - SpringerBriefs in Applied Sciences and Technology 1st ed. 2016 edition
Jiann-Shiun Yuan
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CMOS RF Circuit Design for Reliability and Variability - SpringerBriefs in Applied Sciences and Technology 1st ed. 2016 edition
Jiann-Shiun Yuan
The subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits.
106 pages, 101 black & white illustrations, biography
| Medie | Bøger Paperback Bog (Bog med blødt omslag og limet ryg) |
| Udgivet | 21. april 2016 |
| ISBN13 | 9789811008825 |
| Forlag | Springer Verlag, Singapore |
| Antal sider | 106 |
| Mål | 155 × 235 × 6 mm · 1,83 kg |
