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Test Generation of Crosstalk Delay Faults in VLSI Circuits 1st ed. 2019 edition
Jayanthy
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Test Generation of Crosstalk Delay Faults in VLSI Circuits 1st ed. 2019 edition
Jayanthy
The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults.
156 pages, 30 Tables, color; 7 Illustrations, color; 42 Illustrations, black and white; XI, 156 p. 4
Medie | Bøger Bog |
Udgivet | 10. oktober 2018 |
ISBN13 | 9789811324925 |
Forlag | Springer Verlag, Singapore |
Antal sider | 156 |
Mål | 424 g |
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