Test Generation of Crosstalk Delay Faults in VLSI Circuits - Jayanthy - Bøger - Springer Verlag, Singapore - 9789811324925 - 10. oktober 2018
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Test Generation of Crosstalk Delay Faults in VLSI Circuits 1st ed. 2019 edition

Jayanthy

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R 3.306,25

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Test Generation of Crosstalk Delay Faults in VLSI Circuits 1st ed. 2019 edition

The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults.

156 pages, 30 Tables, color; 7 Illustrations, color; 42 Illustrations, black and white; XI, 156 p. 4

Medie Bøger     Bog
Udgivet 10. oktober 2018
ISBN13 9789811324925
Forlag Springer Verlag, Singapore
Antal sider 156
Mål 424 g

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