Test Generation of Crosstalk Delay Faults in VLSI Circuits - Jayanthy - Bøger - Springer Verlag, Singapore - 9789811324925 - 10. oktober 2018
Ved uoverensstemmelse mellem cover og titel gælder titel

Test Generation of Crosstalk Delay Faults in VLSI Circuits 1st ed. 2019 edition

Jayanthy

Pris
R 3.336,25

Bestilles fra fjernlager

Forventes klar til forsendelse 12. - 18. aug.

Vores kunder siger:

14 dages fuld returret
Topvurdering på Trustpilot
Tilføj til din iMusic ønskeseddel
Eller

Test Generation of Crosstalk Delay Faults in VLSI Circuits 1st ed. 2019 edition

The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults.

156 pages, 30 Tables, color; 7 Illustrations, color; 42 Illustrations, black and white; XI, 156 p. 4

Medie Bøger     Bog
Udgivet 10. oktober 2018
ISBN13 9789811324925
Forlag Springer Verlag, Singapore
Antal sider 156
Mål 424 g

Se alt med Jayanthy ( f.eks. Bog )