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![Cover for Souvik Mahapatra · Fundamentals of Bias Temperature Instability in MOS Transistors: Characterization Methods, Process and Materials Impact, DC and AC Modeling - Springer Series in Advanced Microelectronics (Hardcover bog) [1st ed. 2015 edition] (2015)](https://imusic.b-cdn.net/images/item/original/072/9788132225072.jpg?souvik-mahapatra-2015-fundamentals-of-bias-temperature-instability-in-mos-transistors-characterization-methods-process-and-materials-impact-dc-and-ac-modeling-springer-series-in-advanced-microelectronics-hardcover-bog&class=scaled&v=1473059402)