Fortæl dine venner om denne vare:
Advanced VLSI Design and Testability Issues 1. udgave
Pris
DKK 620
Bestilles fra fjernlager
Forventes klar til forsendelse 5. - 15. okt.
Tilføj til din iMusic ønskeseddel
eller
Advanced VLSI Design and Testability Issues
This book provides in-depth knowledge of VLSI and also the broad aspects of it by explaining its applications in different fields e.g. image processing and biomedical. The role of fault simulation algorithms is very well explained and its implementation using Verilog is the key aspect of this book.
360 pages, 29 Tables, black and white; 192 Illustrations, black and white
| Medie | Bøger Paperback Bog (Bog med blødt omslag og limet ryg) |
| Udgivet | 15. april 2022 |
| ISBN13 | 9780367538361 |
| Forlag | Taylor & Francis Ltd |
| Antal sider | 360 |
| Mål | 154 × 234 × 35 mm · 570 g |
| Sprog | Engelsk |
| Klipper/redaktør | Mohapatra, Sushanta Kumar (Kalinga Institute of Industrial Technology, India.) |
| Klipper/redaktør | Saxena, Sobhit (Lovely Professional University University, India.) |
| Klipper/redaktør | Tripathi, Suman Lata (Lovely Professional University, India) |
