Failure Analysis of Integrated Circuits: Tools and Techniques - The Springer International Series in Engineering and Computer Science - Lawrence C Wagner - Bøger - Chapman and Hall - 9780412145612 - 31. januar 1999
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Failure Analysis of Integrated Circuits: Tools and Techniques - The Springer International Series in Engineering and Computer Science 1999 edition

Lawrence C Wagner

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Failure Analysis of Integrated Circuits: Tools and Techniques - The Springer International Series in Engineering and Computer Science 1999 edition

This "must have" reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits.

255 pages, biography

Medie Bøger     Hardcover bog   (Bog med hård ryg og stift omslag)
Udgivet 31. januar 1999
ISBN13 9780412145612
Forlag Chapman and Hall
Antal sider 255
Mål 155 × 235 × 17 mm   ·   589 g
Sprog Engelsk  
Klipper/redaktør Wagner, Lawrence C.

Se alt med Lawrence C Wagner ( f.eks. Hardcover bog og Paperback Bog )