Failure Analysis of Integrated Circuits: Tools and Techniques - The Springer International Series in Engineering and Computer Science - Lawrence C Wagner - Bøger - Springer-Verlag New York Inc. - 9781461372318 - 9. november 2012
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Failure Analysis of Integrated Circuits: Tools and Techniques - The Springer International Series in Engineering and Computer Science Softcover reprint of the original 1st ed. 1999 edition

Lawrence C Wagner

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Failure Analysis of Integrated Circuits: Tools and Techniques - The Springer International Series in Engineering and Computer Science Softcover reprint of the original 1st ed. 1999 edition

This "must have" reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits.

255 pages, biography

Medie Bøger     Paperback Bog   (Bog med blødt omslag og limet ryg)
Udgivet 9. november 2012
ISBN13 9781461372318
Forlag Springer-Verlag New York Inc.
Antal sider 255
Mål 155 × 235 × 14 mm   ·   385 g
Sprog Engelsk  
Klipper/redaktør Wagner, Lawrence C.

Se alt med Lawrence C Wagner ( f.eks. Hardcover bog og Paperback Bog )