Fortæl dine venner om denne vare:
Analog and Mixed-Signal Boundary-Scan: A Guide to the IEEE 1149.4 Test Standard - Frontiers in Electronic Testing 1999 edition
Adam Osseiran
Pris
₩ 318.750
Bestilles fra fjernlager
Forventes klar til forsendelse 1. - 8. aug.
Tilføj til din iMusic ønskeseddel
Eller
Analog and Mixed-Signal Boundary-Scan: A Guide to the IEEE 1149.4 Test Standard - Frontiers in Electronic Testing 1999 edition
Adam Osseiran
Testing of a system does not follow directly from the testing of its parts, and a system built with testable parts can sometimes be impossible to test. Even if all digital chips are compliant with the standard, the testability of a mixed-signal system cannot be guaranteed.
156 pages, biography
| Medie | Bøger Hardcover bog (Bog med hård ryg og stift omslag) |
| Udgivet | 31. oktober 1999 |
| ISBN13 | 9780792386865 |
| Forlag | Springer |
| Antal sider | 156 |
| Mål | 156 × 234 × 11 mm · 426 g |
| Klipper/redaktør | Osseiran, Adam |
![Cover for Adam Osseiran · Analog and Mixed-signal Boundary-scan: a Guide to the Ieee 1149.4 Test Standard (Paperback Bog) [Softcover Reprint of Hardcover 1st Ed. 1999 edition] (2010)](https://imusic.b-cdn.net/images/item/original/151/9781441951151.jpg?adam-osseiran-2010-analog-and-mixed-signal-boundary-scan-a-guide-to-the-ieee-1149-4-test-standard-paperback-bog&class=scaled&v=1609519059)