Testability Concepts for Digital Ics: the Macro Test Approach - Frontiers in Electronic Testing - Frans P. M. Beenker - Bøger - Kluwer Academic Publishers - 9780792396581 - 30. november 1995
Ved uoverensstemmelse mellem cover og titel gælder titel

Testability Concepts for Digital Ics: the Macro Test Approach - Frontiers in Electronic Testing 1995 edition

Frans P. M. Beenker

Pris
NOK 1.959

Bestilles fra fjernlager

Forventes klar til forsendelse 1. - 7. jul.
Tilføj til din iMusic ønskeseddel
Eller

Findes også som:

Testability Concepts for Digital Ics: the Macro Test Approach - Frontiers in Electronic Testing 1995 edition

Considering the testability aspects for digital ICs, this book integrates the testability aspects into the design and manufacturing of ICs and, for each IC design project, gives a precise definition of the boundary conditions, responsibilities, interfaces and communications between persons, and quality targets.


212 pages, biography

Medie Bøger     Hardcover bog   (Bog med hård ryg og stift omslag)
Udgivet 30. november 1995
ISBN13 9780792396581
Forlag Kluwer Academic Publishers
Antal sider 212
Mål 170 × 244 × 14 mm   ·   498 g
Sprog Engelsk