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Testability Concepts for Digital Ics: the Macro Test Approach - Frontiers in Electronic Testing 1995 edition
Frans P. M. Beenker
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Testability Concepts for Digital Ics: the Macro Test Approach - Frontiers in Electronic Testing 1995 edition
Frans P. M. Beenker
Considering the testability aspects for digital ICs, this book integrates the testability aspects into the design and manufacturing of ICs and, for each IC design project, gives a precise definition of the boundary conditions, responsibilities, interfaces and communications between persons, and quality targets.
212 pages, biography
Medie | Bøger Hardcover bog (Bog med hård ryg og stift omslag) |
Udgivet | 30. november 1995 |
ISBN13 | 9780792396581 |
Forlag | Kluwer Academic Publishers |
Antal sider | 212 |
Mål | 170 × 244 × 14 mm · 498 g |
Sprog | Engelsk |
Se alt med Frans P. M. Beenker ( f.eks. Hardcover bog og Paperback Bog )