From Contamination to Defects, Faults and Yield Loss: Simulation and Applications - Frontiers in Electronic Testing - Jitendra B. Khare - Bøger - Springer - 9780792397144 - 30. april 1996
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From Contamination to Defects, Faults and Yield Loss: Simulation and Applications - Frontiers in Electronic Testing 1996 edition

Jitendra B. Khare

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From Contamination to Defects, Faults and Yield Loss: Simulation and Applications - Frontiers in Electronic Testing 1996 edition

Given such a high level of investment, it is critical for IC manufacturers to reduce manufacturing costs and get a better return on their investment. The most obvious method of reducing the manufacturing cost per die is to improve manufacturing yield.

150 pages, biography

Medie Bøger     Hardcover bog   (Bog med hård ryg og stift omslag)
Udgivet 30. april 1996
ISBN13 9780792397144
Forlag Springer
Antal sider 150
Mål 155 × 235 × 11 mm   ·   417 g
Sprog Engelsk  

Se alt med Jitendra B. Khare ( f.eks. Hardcover bog og Paperback Bog )