Test and Diagnosis of Analogue, Mixed-signal and Rf Integrated Circuits: the System on Chip Approach - Materials, Circuits and Devices - - Bøger - Institution of Engineering and Technolog - 9780863417450 - 30. maj 2008
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Test and Diagnosis of Analogue, Mixed-signal and Rf Integrated Circuits: the System on Chip Approach - Materials, Circuits and Devices

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This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits, and systems in a single source. The book reports systematically the state of the arts and future research directions of those areas.

408 pages, Illustrations

Medie Bøger     Paperback Bog   (Bog med blødt omslag og limet ryg)
Udgivet 30. maj 2008
ISBN13 9780863417450
Forlag Institution of Engineering and Technolog
Antal sider 408
Mål 159 × 232 × 23 mm   ·   612 g
Klipper/redaktør Sun, Yichuang