Digital Noise Monitoring of Defect Origin - Lecture Notes in Electrical Engineering - Telman Aliev - Bøger - Springer-Verlag New York Inc. - 9781441944108 - 24. november 2010
Ved uoverensstemmelse mellem cover og titel gælder titel

Digital Noise Monitoring of Defect Origin - Lecture Notes in Electrical Engineering Softcover reprint of hardcover 1st ed. 2007 edition

Telman Aliev

Pris
zł 489,90

Bestilles fra fjernlager

Forventes klar til forsendelse 6. - 12. aug.
Tilføj til din iMusic ønskeseddel
Eller

Findes også som:

Digital Noise Monitoring of Defect Origin - Lecture Notes in Electrical Engineering Softcover reprint of hardcover 1st ed. 2007 edition

This book explores the initial stage of the origin of the defect taking into account technical, biological, and other features of several technologies. These technologies allow the defect monitoring at the beginning of the defect origin to be performed at the expense of extracting information from the noise.


224 pages, biography

Medie Bøger     Paperback Bog   (Bog med blødt omslag og limet ryg)
Udgivet 24. november 2010
ISBN13 9781441944108
Forlag Springer-Verlag New York Inc.
Antal sider 224
Mål 155 × 235 × 12 mm   ·   335 g
Sprog Engelsk  

Vis alle

Mere med Telman Aliev