From Contamination to Defects, Faults and Yield Loss: Simulation and Applications - Frontiers in Electronic Testing - Jitendra B. Khare - Bøger - Springer-Verlag New York Inc. - 9781461285953 - 26. september 2011
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From Contamination to Defects, Faults and Yield Loss: Simulation and Applications - Frontiers in Electronic Testing Softcover reprint of the original 1st ed. 1996 edition

Jitendra B. Khare

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From Contamination to Defects, Faults and Yield Loss: Simulation and Applications - Frontiers in Electronic Testing Softcover reprint of the original 1st ed. 1996 edition

Given such a high level of investment, it is critical for IC manufacturers to reduce manufacturing costs and get a better return on their investment. The most obvious method of reducing the manufacturing cost per die is to improve manufacturing yield.

150 pages, biography

Medie Bøger     Paperback Bog   (Bog med blødt omslag og limet ryg)
Udgivet 26. september 2011
ISBN13 9781461285953
Forlag Springer-Verlag New York Inc.
Antal sider 150
Mål 155 × 235 × 9 mm   ·   249 g
Sprog Engelsk  

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