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Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience 1st ed. 2017 edition
Jian Min Zuo
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Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience 1st ed. 2017 edition
Jian Min Zuo
As the title implies, the focus of the book has changed from electron microdiffraction and convergent beam electron diffraction to all forms of advanced transmission electron microscopy.
755 pages, 92 black & white illustrations, 218 colour illustrations, biography
Medie | Bøger Hardcover bog (Bog med hård ryg og stift omslag) |
Udgivet | 26. oktober 2016 |
ISBN13 | 9781493966059 |
Forlag | Springer-Verlag New York Inc. |
Antal sider | 729 |
Mål | 155 × 235 × 44 mm · 1,56 kg |
Sprog | Engelsk |
Se alt med Jian Min Zuo ( f.eks. Hardcover bog )