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Design for Testability, Debug and Reliability: Next Generation Measures Using Formal Techniques 1st ed. 2021 edition
Sebastian Huhn
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Design for Testability, Debug and Reliability: Next Generation Measures Using Formal Techniques 1st ed. 2021 edition
Sebastian Huhn
This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications.
164 pages, 75 Tables, color; 25 Illustrations, color; 22 Illustrations, black and white; XXI, 164 p.
| Medie | Bøger Hardcover bog (Bog med hård ryg og stift omslag) |
| Udgivet | 20. april 2021 |
| ISBN13 | 9783030692087 |
| Forlag | Springer Nature Switzerland AG |
| Antal sider | 164 |
| Mål | 439 g |
| Sprog | Tysk |
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