Hf-Based High-k Dielectrics: Process Development, Performance Characterization, and Reliability - Synthesis Lectures on Solid State Materials and Devices - Young-Hee Kim - Bøger - Springer International Publishing AG - 9783031014246 - 31. december 2007
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Hf-Based High-k Dielectrics: Process Development, Performance Characterization, and Reliability - Synthesis Lectures on Solid State Materials and Devices

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Hard breakdown and soft breakdown, particularly the Weibull slopes, were studied under constant voltage stress. The origin of soft breakdown (first breakdown) was studied and the results suggested that the soft breakdown may be due to one layer breakdown in the bilayer structure (HfO2/SiO2: 4 nm/4 nm).


92 pages, X, 92 p.

Medie Bøger     Paperback Bog   (Bog med blødt omslag og limet ryg)
Udgivet 31. december 2007
ISBN13 9783031014246
Forlag Springer International Publishing AG
Antal sider 92
Mål 234 × 191 × 13 mm   ·   220 g
Sprog Engelsk  

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