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Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM 2nd ed. 2016 edition
R.F. Egerton
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Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM 2nd ed. 2016 edition
R.F. Egerton
Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences.
207 pages, 109 black & white illustrations, 15 colour illustrations, biography
| Medie | Bøger Hardcover bog (Bog med hård ryg og stift omslag) |
| Udgivet | 7. juli 2016 |
| ISBN13 | 9783319398761 |
| Forlag | Springer International Publishing AG |
| Antal sider | 196 |
| Mål | 165 × 243 × 22 mm · 471 g |
| Sprog | Tysk |
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