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Electron Energy-Loss Spectroscopy in the Electron Microscope 3rd ed. 2011 edition
R.F. Egerton
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Electron Energy-Loss Spectroscopy in the Electron Microscope 3rd ed. 2011 edition
R.F. Egerton
Within the last 30 years, electron energy-loss spectroscopy (EELS) has become a standard analytical technique used in the transmission electron microscope to extract chemical and structural information down to the atomic level.
491 pages, biography
| Medie | Bøger Paperback Bog (Bog med blødt omslag og limet ryg) |
| Udgivet | 1. oktober 2014 |
| ISBN13 | 9781489986498 |
| Forlag | Springer-Verlag New York Inc. |
| Antal sider | 491 |
| Mål | 235 × 154 × 34 mm · 770 g |
| Sprog | Engelsk |
![Cover for R.F. Egerton · Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM (Paperback Bog) [Softcover reprint of the original 2nd ed. 2016 edition] (2018)](https://imusic.b-cdn.net/images/item/original/860/9783319819860.jpg?r-f-egerton-2018-physical-principles-of-electron-microscopy-an-introduction-to-tem-sem-and-aem-paperback-bog&class=scaled&v=1611612371)
![Cover for R.F. Egerton · Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM (Hardcover bog) [2nd ed. 2016 edition] (2016)](https://imusic.b-cdn.net/images/item/original/761/9783319398761.jpg?r-f-egerton-2016-physical-principles-of-electron-microscopy-an-introduction-to-tem-sem-and-aem-hardcover-bog&class=scaled&v=1595770512)
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