Phase Change Memory: Device Physics, Reliability and Applications -  - Bøger - Springer International Publishing AG - 9783319690520 - 28. november 2017
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Phase Change Memory: Device Physics, Reliability and Applications 1st ed. 2018 edition

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This book describes the physics of phase change memory devices, starting from basic operation to reliability issues. The book also contains design engineering details on PCM cell architecture, PCM cell arrays (including electrical circuit management), as well as the full spectrum of possible future applications.


330 pages, 40 Tables, color; 196 Illustrations, color; 24 Illustrations, black and white; XVIII, 330

Medie Bøger     Hardcover bog   (Bog med hård ryg og stift omslag)
Udgivet 28. november 2017
ISBN13 9783319690520
Forlag Springer International Publishing AG
Antal sider 330
Mål 150 × 220 × 20 mm   ·   666 g
Sprog Tysk  
Klipper/redaktør Redaelli, Andrea

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