Hot-Carrier Reliability of MOS VLSI Circuits - The Springer International Series in Engineering and Computer Science - Yusuf Leblebici - Bøger - Springer - 9780792393528 - 30. juni 1993
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Hot-Carrier Reliability of MOS VLSI Circuits - The Springer International Series in Engineering and Computer Science 1993 edition

Yusuf Leblebici

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Hot-Carrier Reliability of MOS VLSI Circuits - The Springer International Series in Engineering and Computer Science 1993 edition

The development and use of accurate reliability simulation tools are therefore crucial for early assessment and improvement of circuit reliability : Once the long-term reliability of the circuit is estimated through simulation, the results can be compared with predetermined reliability specifications or limits.

229 pages, biography

Medie Bøger     Hardcover bog   (Bog med hård ryg og stift omslag)
Udgivet 30. juni 1993
ISBN13 9780792393528
Forlag Springer
Antal sider 212
Mål 155 × 235 × 14 mm   ·   508 g
Sprog Engelsk  

Se alt med Yusuf Leblebici ( f.eks. Hardcover bog og Paperback Bog )