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Modeling and Characterization of Advanced Bipolar Transistors and Interconnects for Circuit Simulation Jiann-Shiun Yuan
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Modeling and Characterization of Advanced Bipolar Transistors and Interconnects for Circuit Simulation
Jiann-Shiun Yuan
| Medie | Bøger Bog |
| Udgivet | 27. oktober 2022 |
| ISBN13 | 9781019258682 |
| Forlag | Creative Media Partners, LLC |
| Mål | 150 × 220 × 20 mm · 462 g |
| Sprog | Engelsk |
![Cover for Jiann-Shiun Yuan · CMOS RF Circuit Design for Reliability and Variability - SpringerBriefs in Applied Sciences and Technology (Paperback Bog) [1st ed. 2016 edition] (2016)](https://imusic.b-cdn.net/images/item/original/825/9789811008825.jpg?jiann-shiun-yuan-2016-cmos-rf-circuit-design-for-reliability-and-variability-springerbriefs-in-applied-sciences-and-technology-paperback-bog&class=scaled&v=1502213797)