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Introduction to Advanced System-on-Chip Test Design and Optimization - Frontiers in Electronic Testing 2005 edition
Erik Larsson
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Introduction to Advanced System-on-Chip Test Design and Optimization - Frontiers in Electronic Testing 2005 edition
Erik Larsson
SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling.
388 pages, biography
| Medie | Bøger Hardcover bog (Bog med hård ryg og stift omslag) |
| Udgivet | 7. november 2005 |
| ISBN13 | 9781402032073 |
| Forlag | Springer-Verlag New York Inc. |
| Antal sider | 388 |
| Mål | 156 × 232 × 23 mm · 1,09 kg |
| Sprog | Engelsk |
Se alt med Erik Larsson ( f.eks. Hardcover bog , PDF og Paperback Bog )