Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability - Frontiers in Electronic Testing - Mohammad Tehranipoor - Bøger - Springer-Verlag New York Inc. - 9781441945136 - 23. november 2010
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Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability - Frontiers in Electronic Testing Softcover reprint of hardcover 1st ed. 2008 edition

Mohammad Tehranipoor

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Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability - Frontiers in Electronic Testing Softcover reprint of hardcover 1st ed. 2008 edition

Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes.


422 pages, black & white illustrations

Medie Bøger     Paperback Bog   (Bog med blødt omslag og limet ryg)
Udgivet 23. november 2010
ISBN13 9781441945136
Forlag Springer-Verlag New York Inc.
Antal sider 408
Mål 155 × 235 × 21 mm   ·   589 g
Sprog Engelsk  
Klipper/redaktør Tehranipoor, Mohammad

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