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Scanning Electron Microscopy and X Ray Microanalysis Joseph Goldstein 3rd ed. 2003. Softcover reprint of the original 3r edition
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Scanning Electron Microscopy and X Ray Microanalysis
Joseph Goldstein
This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis.
709 pages, biography
| Medie | Bøger Bog |
| Udgivet | 31. maj 2013 |
| ISBN13 | 9781461349693 |
| Forlag | Springer-Verlag New York Inc. |
| Antal sider | 689 |
| Mål | 255 × 182 × 43 mm · 1,22 kg |
| Sprog | Engelsk |