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Delay Fault Testing for VLSI Circuits - Frontiers in Electronic Testing Softcover reprint of the original 1st ed. 1998 edition
Angela Krstic
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Delay Fault Testing for VLSI Circuits - Frontiers in Electronic Testing Softcover reprint of the original 1st ed. 1998 edition
Angela Krstic
In that sense, this book is the best x DELAY FAULT TESTING FOR VLSI CIRCUITS available guide for an engineer designing or testing VLSI systems. Tech niques for path delay testing and for use of slower test equipment to test high-speed circuits are of particular interest.
191 pages, biography
| Medie | Bøger Paperback Bog (Bog med blødt omslag og limet ryg) |
| Udgivet | 12. oktober 2012 |
| Oprindeligt udgivet | 1998 |
| ISBN13 | 9781461375616 |
| Forlag | Springer-Verlag New York Inc. |
| Antal sider | 191 |
| Mål | 155 × 235 × 11 mm · 299 g |
| Sprog | Engelsk |
Se alt med Angela Krstic ( f.eks. Hardcover bog og Paperback Bog )