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Design for AT-Speed Test, Diagnosis and Measurement - Frontiers in Electronic Testing Softcover reprint of the original 1st ed. 2000 edition
Benoit Nadeau-dostie
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Design for AT-Speed Test, Diagnosis and Measurement - Frontiers in Electronic Testing Softcover reprint of the original 1st ed. 2000 edition
Benoit Nadeau-dostie
Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels.
239 pages, biography
Medie | Bøger Paperback Bog (Bog med blødt omslag og limet ryg) |
Udgivet | 26. april 2013 |
ISBN13 | 9781475782912 |
Forlag | Springer-Verlag New York Inc. |
Antal sider | 239 |
Mål | 178 × 254 × 14 mm · 458 g |
Sprog | Engelsk |
Klipper/redaktør | Nadeau-Dostie, Benoit |
Se alt med Benoit Nadeau-dostie ( f.eks. Hardcover bog og Paperback Bog )