Design for AT-Speed Test, Diagnosis and Measurement - Frontiers in Electronic Testing - Benoit Nadeau-dostie - Bøger - Springer-Verlag New York Inc. - 9781475782912 - 26. april 2013
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Design for AT-Speed Test, Diagnosis and Measurement - Frontiers in Electronic Testing Softcover reprint of the original 1st ed. 2000 edition

Benoit Nadeau-dostie

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Design for AT-Speed Test, Diagnosis and Measurement - Frontiers in Electronic Testing Softcover reprint of the original 1st ed. 2000 edition

Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels.

239 pages, biography

Medie Bøger     Paperback Bog   (Bog med blødt omslag og limet ryg)
Udgivet 26. april 2013
ISBN13 9781475782912
Forlag Springer-Verlag New York Inc.
Antal sider 239
Mål 178 × 254 × 14 mm   ·   458 g
Sprog Engelsk  
Klipper/redaktør Nadeau-Dostie, Benoit

Se alt med Benoit Nadeau-dostie ( f.eks. Hardcover bog og Paperback Bog )