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Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials - Springer Series in Advanced Microelectronics Third Edition 2018 edition
Otwin Breitenstein
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Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials - Springer Series in Advanced Microelectronics Third Edition 2018 edition
Otwin Breitenstein
Reviewing various experimental approaches to LIT, particularly the commercial LIT systems available, this 3rd edition introduces new LIT applications, such as illuminated LIT applied to solar cells, non-thermal LIT lifetime mapping and LIT application to spin caloritronics problems.
321 pages, 68 Illustrations, color; 55 Illustrations, black and white; XVIII, 321 p. 123 illus., 68
| Medie | Bøger Hardcover bog (Bog med hård ryg og stift omslag) |
| Udgivet | 22. januar 2019 |
| ISBN13 | 9783319998244 |
| Forlag | Springer International Publishing AG |
| Antal sider | 321 |
| Mål | 657 g |
| Sprog | Tysk |
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