Fundamentals of Bias Temperature Instability in MOS Transistors: Characterization Methods, Process and Materials Impact, DC and AC Modeling - Springer Series in Advanced Microelectronics - Souvik Mahapatra - Bøger - Springer, India, Private Ltd - 9788132225072 - 14. august 2015
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Fundamentals of Bias Temperature Instability in MOS Transistors: Characterization Methods, Process and Materials Impact, DC and AC Modeling - Springer Series in Advanced Microelectronics 1st ed. 2015 edition

Souvik Mahapatra

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Fundamentals of Bias Temperature Instability in MOS Transistors: Characterization Methods, Process and Materials Impact, DC and AC Modeling - Springer Series in Advanced Microelectronics 1st ed. 2015 edition

269 pages, 133 black & white illustrations, 68 colour illustrations, 17 black & white tables, biogra

Medie Bøger     Hardcover bog   (Bog med hård ryg og stift omslag)
Udgivet 14. august 2015
ISBN13 9788132225072
Forlag Springer, India, Private Ltd
Antal sider 269
Mål 155 × 235 × 20 mm   ·   689 g
Klipper/redaktør Mahapatra, Souvik

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